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ISBD

[Linear|ISBD|MARC Tags]

 
  621.3972
REL
Strong, Alvin W.

Reliability Wearout Mechanisms in Advanced Cmos Technologies / Canada : John Wiley, 2009

xv, 624 p. 24 cm



ISBN: 0471731726



00013595 (RUJUKAN)
00013596 (PINJAMAN)
00013597 (PINJAMAN)