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621.3972 REL
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Strong, Alvin W.
Reliability Wearout Mechanisms in Advanced Cmos Technologies / Canada : John Wiley, 2009
xv, 624 p. 24 cm
ISBN: 0471731726
00013595 (RUJUKAN) 00013596 (PINJAMAN) 00013597 (PINJAMAN) |
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