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621.381
VOL
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Voldman, Steven h.
ESD : failure mechanisms and models / New Jersey : john wiley, 2009
xv,384 p. 25 cm
ISBN: 0470511374
1.semiconductors-Failures650 0 2. Integrated circuits-Protection650 0 3. Integrated circuits -testing 650 0 4. Integrated ciruits -Reliability 650 0 5. Eletric discharges
00013512 (PINJAMAN)
00013513 (RUJUKAN)
00013524 (PINJAMAN)
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