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[Paparan
Linear|ISBD|MARC
Tags]
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NO KAWALAN: |
00008750 |
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NO PANGGILAN: |
621.381 VOL |
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ENTRI UTAMA (PERSEORANGAN): |
Voldman, Steven h. |
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ENTRI UTAMA (BADAN BERGABUNG): |
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JUDUL
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ESD : failure mechanisms and models
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PENERBIT: |
john wiley |
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ISBN/ISSN: |
0470511374 |
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HURAIAN FIZIKAL: |
xv,384 p. 25 cm |
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EDISI
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TAJUK PERKARA (TOPIK): |
1.semiconductors-Failures650 0 |
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TAJUK PERKARA (TOPIK): |
2. Integrated circuits-Protection650 0 |
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TAJUK PERKARA (TOPIK): |
3. Integrated circuits -testing 650 0 |
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TAJUK PERKARA (TOPIK): |
4. Integrated ciruits -Reliability 650 0 |
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TAJUK PERKARA (TOPIK): |
5. Eletric discharges |
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